This application note provides some general guidelines for specifying radio frequency (RF) and microwave probes for doing in-situ testing of microelectronics integrated circuits (that is, chips) and the electronic part(s) of opto-electronic chips.
All CMC Microsystem account holders with a Professor Research Subscription are authorized to access this application note. For more information, contact our Licensing Administrator at licensing@cmc.ca or 613-530-4787.
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