Prepared by Alain Rousson, Tony Chan Carusone, Integrated Systems Laboratory, University of Toronto, and Robert Mallard, CMC Microsystems.
This application note provides a general overview of methods for testing the Bit Error Rate (BER) of a digital transmission system. It also describes a specific example of how the Centellax TG1B1-A BER test instrument available to Canadian academic researchers through the CMC test equipment lending pool may be used for the measurement of the BER of an integrated photodiode fabricated in 90nm CMOS.
