The FLEX tester from Teradyne Inc. is a monolithic test system which is optimized for testing mixed-signal microelectronic circuits and microsystems. The FLEX tester is comprised of a number of discrete, but integrated test instruments, addressing a range of mixed-signal characterization needs, including DC sources and meters, up to RF characterization in the electrical domain. This tester is the core test equipment used in the Advanced Mixed-Signal Systems Lab (AMSSL) of the National Microelectronics and Photonics Testing Collaboratory (NMPTC), managed by CMC Microsystems. As with test equipment in other labs of the Collaboratory, users can access the FLEX tester in-person at the lab’s location at McGill University (Montréal, Québec), or remotely over the Internet.
CMC provides an evolving list of training materials so that users can optimize their planning for and use of the FLEX tester. Additional support is available from the test engineer at the AMSSL.
