This application note was prepared by CMC with Dr. Yongjun Lai, Department of Mechanical and Material Engineering, Queen’s University. It provides researchers with the following:
- A starting point for learning how to develop a test platform with the capability to test devices in a dynamically pressure changing environment.
- A method to test the dynamic behavior of MEMS pressure sensors to achieve better accuracy and wider application range.
- A means to accelerate the test fixture development stage to achieve faster realization of research concepts.
CMC is collaborating with researchers at Canadian universities to build a library of microsystems application notes. These documents are intended to help extend microsystems research in Canada by describing new techniques, processes, and design tools relating to microsystems, and to help stimulate new ideas that accelerate research and development activities.
All CMC Microsystem account holders with a Subscription are authorized to access this application note. For more information contact Linda Dougherty at licensing@cmc.ca or 613-530-4787.
